Home Computer Science Hardware Security and Trust: Design and Deployment of Integrated Circuits in a Threatened Environment
Fault Injection Through Focused Ion Beams
Focused Ion Beams (FIB) are a very expensive way to inject fault into the device, however they allows the attacker to arbitrarily modify the structure of a circuit. The adversary can cut existing wires, add connections, and operated through different layers. The capability of these tools are demonstrated in Torrance et al. , where the authors showed the reconstruction of a bus without damaging the contents of the memory. FIB equipment is expensive and needs high technical expertise, but the precision is extremely high. Current FIBs are able to operate with precision up to 2.5 nm, i.e., less than a tenth of the gate width of the smallest transistor that can currently be etched.
Table 2.1 Comparison of fault injection techniques
Fault Attacks, Injection Techniques and Tools for Simulation
Comparison of Fault Injection Techniques
The previously introduced fault injection techniques have several parameters to define its application. The most important parameters are compared in Table2.2.
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