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Subaperture Aberrations: Methods for Subaperture Layout Design

Subaperture layout design must meet two basic requirements. One is the full aperture coverage. The other is that subaperture fringes must be reduced to be resolvable. It depends greatly on the subaperture aberrations. Further, consideration may include the lateral resolution and overlapping ratio. For example, a slow TS (of larger f/number) is sometimes selected on purpose to measure much smaller subapertures with a higher lateral resolution for spherical surfaces. The overlapping ratio is the ratio of the overlapping area to the subaperture area. As a rule of a thumb, an increase in the overlapping ratio can reduce measurement uncertainty due to the averaging effect. Smith et al.54 developed two rules of thumb for estimating the propagation of measurement noises during subaperture stitching. They finally derived an analytical expression for how noise in an annular ring of subapertures leads to large-scale errors in the computed stitched surface,55 which is insightful for subaperture layout design.

Overlapping ratio determined by the center-to-center distance

Figure 5 Overlapping ratio determined by the center-to-center distance.

 
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